Used JEOL JSM 5400 #9176404 for sale

JEOL JSM 5400 is a high performance scanning electron microscope (SEM) designed for a variety of imaging and analytical needs. The versatile instrument package features a high-resolution SEM equipment combined with a high vacuum chamber and a wide selection of detectors and sample stages. This combination of technologies gives the microscope unsurpassed flexibility and capability for both imaging and analysis. The SEM has a variable pressure secondary column with a maximum working pressure of 5 x 10-7 Pa. This helps to keep contaminants away from the sample for better imaging clarity. The direct beam alignment system ensures that sample positioning is precise, which helps to accurately measure sample features. The high voltage power supply allows for a wide range of electron beam energies, making it suitable for a variety of materials, including but not limited to metals, semiconductors, insulators, hydrocarbons and molecular crystals. JSM 5400 also offers a wide selection of imaging and analysis detectors, including an energy saving energy-dispersive X-ray spectrometer (EDS), an energy filtered transmission electron microscopy (EFTEM) detector, a secondary electron detector (SED) and an ion beam analysis detector (IBAD). With the EDS and SED detectors, the user can quickly and easily characterize sample properties and perform elemental mapping to get detailed insight into sample composition. The EFTEM is used for elemental mapping and for studying the ultrastructure of samples without artifficial inclusions. The IBAD detector allows for a range of ion beam analysis techniques. The microscope has a unique sample manipulation unit that allows for automated visualization and manipulation of multiple samples. The automated sample handling allows for faster sample preparation and easier sample movement. The specialized environmental control machine is designed to maintain a constant temperature and humidity to keep the sample stable in the high vacuum environment of the SEM. JEOL JSM 5400 has a relatively small footprint and high user-friendliness, which makes it an ideal choice for analytical laboratories, research facilities, and even manufacturing and industry applications. With a large range of displayed image resolution and field size capabilities, JSM 5400 can provide excellent imaging, high quality data visualization and powerful analysis capability for a variety of sample types.