Used JEOL JSM 5400 #9373250 for sale

JEOL JSM 5400 is a scanning electron microscope used in a variety of applications. It has an acceleration voltage of 0.5 to 30 kV and a magnification of up to 300,000x. The electron column in the microscope has been designed to optimize objective lens performance, which in turn enhances resolution. This means that JSM 5400 can be used for high-resolution imaging in both the scanning and transmission electron microscopy modes. The microscope is also equipped with an annular dark field detector (ADF) that can achieve high contrast imaging. JEOL JSM 5400 also features a range of automated functions, allowing scientists to focus on the desired element rather than manual operation. Automated functions include drift correction, magnification control, and the ability to quickly switch between imaging angles. It also comes with advanced software that can automatically measure a range of properties, such as grain size, particle size, and specimen characteristics. JSM 5400 is suitable for a range of samples, including biological samples, and can be used to study a range of features, including proteins, viruses, polymers, and other nanoscale structures. It allows for detailed characterisation of these features, including topography and chemical composition. In addition to high-resolution imaging, JEOL JSM 5400 is also equipped with a range of accessories, such as an omega stage, which enables easy sample movement and an in-column analytical chamber, which facilitates various analytical techniques, including EDS and EBSD. It also has an integrated gas handling system, which is used when performing vacuum-based experiments. JSM 5400 is a versatile and reliable microscope, offering numerous advantages for researchers. Its powerful electron optics, automated functions, and range of analytical accessories give it a great advantage over other scanning electron microscopes. It offers researchers detailed images with high accuracy and a range of analytical techniques suitable for a wide variety of samples.