Used JEOL JSM 5410 / MP 5410 #128977 for sale

JEOL JSM 5410 / MP 5410 is a scanning electron microscope (SEM) with a high-resolution field emission gun (FEG) that provides superior high resolution imaging over a wide range of applications. JSM 5410 / MP 5410 features an advanced digital multi-channel electron optics design, variable aperture control and a wide high resolution Digital Signal Processor (DSP) image capture equipment. JEOL JSM 5410 / MP 5410 utilizes a high performing 500 mm aperture field emission gun along with a unique new Equibar™ SuperDyn™ electron optics system to offer greater imaging clarity. This imaging unit also includes High Dynamic Range (HDR) imaging with High Index Longitudinal Redesign (HILR) to ensure the highest possible resolution and best imaging results. JSM 5410 / MP 5410 offers superior imaging capabilities with a wide range of magnification and features a large array of analytical tools. These include Energy Dispersive X-ray (EDX) analysis for material elemental mapping, Atomic Force Microscopy (AFM) for measuring surface topography, Electron Back-Scattering Diffraction (EBSD) for grain characteristics mapping, and Particle Identification PET (PIE) for contamination/particle analysis. JEOL JSM 5410 / MP 5410 digital image capture machine offers an array of features for the user. This includes the ability to capture single exposure images as well as multiple-frame images with an integration time up to 30 minutes. The digital processor also opens the possibility to use an advanced noise filter algorithm and to view a larger field of view in both in contrast and intensity. The tool also provides excellent video outputs, which allow quick previewing of images both on the display and on secondary devices. Output can also be processed in real time and filtered to create an even higher quality image. The detector of JSM 5410 / MP 5410 can be operated in either Auto or Manual Gain Control (AGC) mode to optimize contrast and image resolution. Overall, JEOL JSM 5410 / MP 5410 is a scanning electron microscope designed for high-resolution imaging over a wide range of applications. This SEM features a 500 mm aperture field emission gun and Equibar™ SuperDyn™ electron optics asset providing excellent imaging clarity with a variety of imaging tools. Advanced digital signal processing provides a range of features such as a noise filter algorithm and real-time image processing to optimize image clarity.