Used JEOL JSM 5410 #293619134 for sale

JEOL JSM 5410 is a scanning electron microscope (SEM), designed for high-resolution imaging and analysis of ultrafine structures. It is equipped with a Field Emission Gun (FEG) and a range of features for a variety of applications. The FEG produces electrons with an energy of up to 7 keV and a spot size of 1 nm for high resolution imaging, making JSM 5410 ideal for examining the finer details of samples. It can also be used at lower voltages for larger structures such as features on integrated circuits. JEOL JSM 5410 is equipped with a closed-circuit digital imaging equipment, comprising an ultra-stable three slide PentaScan stage, a quick scan module, and a 31 cm/pixel variable scan module. This enables micron-level precision in sample positioning and navigation, as well as flexible sampling speed. The microscope also includes a secondary electron (SE) detector, a backscattered electron (BSE) detector, and a high-performance digital imaging system. JSM 5410 uses a hybrid imaging detecting unit, with a pixel array detector, a scintillation detector, and a phosphor-direct readout machine. This hybrid tool allows for superior detection efficiency in comparison to a single detector asset. JEOL JSM 5410 incorporates a range of software packages for image acquisition and analysis, including JEOL Autoscan software which provides automated controls for microscope scanning, imaging, and measurements. Additionally, JEOL Image Analyzer software provides powerful quantitative and qualitative analysis of SEM images. JSM 5410 also offers a range of external interfaces and options, including a pattern generator and an air streamer for microscope cleaning. This advanced electron microscope offers various operational modes, high-quality imaging, and a wide range of features for a variety of imaging and analysis tasks.