Used JEOL JSM 5410LV #9080015 for sale

JEOL JSM 5410LV is an advanced Scanning Electron Microscope (SEM). This model of SEM is a high-performance instrument that provides imaging and analysis for a broad range of scientific and industrial applications. It was designed to provide both high magnification and high performance, allowing for analysis of the finest details of a sample. JSM 5410LV is equipped with a variation of high-throughput detectors designed to detect particles with a wide range of energies. One of the detectors is a Schottky Field Emission Gun (FEG) that produces high-resolution imaging for even the most delicate specimens. This microscopy equipment features an advanced Field Emission Scanning Electron Microscope (FE-SEM) and a low-voltage scanning electron detector (LVSEM). This microscope is equipped with a high-precision multi-axis stage that provides accurate and reliable sample manipulation. Additionally, an automatic sample transfer system allows for fast and consistent alignment of the sample on the stage. This allows for smooth workflows and accurate positioning of different parts of the sample for analysis and imaging. The JSM 5610 is capable of a variety of applications, such as phase contrast imaging, back-scatter imaging, secondary electron imaging and chemical imaging. It also supports a variety of analytical techniques, including energy dispersive X-ray spectroscopy, Auger electron spectroscopy, cathodoluminescence, and low voltage scanning electron microscopy (LV-SEM). In addition to the high-performance features of the unit, it is also equipped with the latest in graphical user interface (GUI) technology, which makes the machine easy to use and provides convenient data visualizations. JEOL JSM 5410LV is also built with robustness in mind and it is designed to operate in a wide range of environmental extremes. JSM 5410LV Scanning Electron Microscope is a powerful instrument for hard science and industrial applications. It provides high-resolution images along with analytical capabilities, and it is built to provide robust operation in a wide range of environmental extremes. With its versatile multi-axis stage, high-performance detectors, and user-friendly graphical user interface, JEOL JSM 5410LV is an ideal choice for those looking for an advanced and capable SEM for analyzing samples.