Used JEOL JSM 5500 #9103747 for sale

JEOL JSM 5500 is an advanced scanning electron microscope (SEM) designed to provide high-resolution images of both non-conductive and conductive materials. It uses secondary electrons (SEs) and X-rays to test sample properties and can be used for imaging both metal and non-metal samples. JSM 5500 has a variable accelerating voltage control range of up to 100,000 volts (100kV). This allows for detailed physical mapping of an object's surface, as well as 3-dimensional imaging. It also features an advanced auto-convergence capability, which automatically adjusts the voltage, current, and image distance to provide optimal resolution. JEOL JSM 5500 is equipped with an Auto-alignment and Object Tracking Equipment which allows for precise sample alignment and measurement. This system includes a motor-driven stage, which allows for the repositioning of the stage and sample during scans with no adjustment of focus. This feature also eliminates the need for manual sample alignment, allowing for accurate and consistent scans. JSM 5500 features a unique ESE (environmental scanning electron) detector, which allows for the analysis of samples at a low voltage, without the need for charge compensation, and with a higher degree of resolution. This unit also provides valuable data about the sample environment, including temperature, pressure, and degree of interaction between the sample and the electron beam. JEOL JSM 5500 is capable of producing a variety of image types and magnifications. Magnification ranges from 0.8x to 800,000x, with a field-capable scan area of up to 85 mm. This machine also includes a dedicated sample holder, which eliminates the need for manual transfers of sample stages, reducing the chances of contamination and sample damage. In addition to imaging samples, JSM 5500 is also capable of performing analytical tasks, such as elemental analysis, detection of chemical compounds, and measurement of physical properties such as hardness and elasticity. This allows for the collection of a wide variety of data which can be used for detailed scientific investigations. JEOL JSM 5500 is an advanced and user-friendly scanning electron microscope. Its features, including auto-alignment and object tracking, a wide range of magnifications, a dedicated sample holder, and ESE detector, make this tool suitable for a range of scientific and industrial applications, including sample analysis and imaging.