Used JEOL JSM 5500LV #293634854 for sale

JEOL JSM 5500LV
ID: 293634854
Vintage: 2001
Scanning Electron Microscope (SEM) Operation keyboard RS232C Board Interface: vacuum, scanning Adaptment / control unit Fine coater Chiller JED-2201 EDS EDS Integration 2001 vintage.
JEOL JSM 5500LV is a scanning electron microscope (SEM) used for scanning and imaging sites of interest on a wide range of samples. It is a high performance scanning electron microscope with a host of features for superior performance. JSM 5500LV provides an impressive resolution of 1.5 nm on the secondary electrons, allowing the user to clearly see details of the sample on a nanoscale. Additionally, with its high vacuum of 1.2x10-8 Torr, this SEM produces superior secondary electron images with minimal charging or sample drift. The core of the instrument is a moving SEM column held in a magnetically suspended chamber, providing a stable environment for the electrons. The system has a field emission stimulated-emission-depression (FE-SED) emission electron source which enables high resolution imaging and a high current for better luminescence and spectroscopy. In addition, its unique interface design allows the user to operate the instrument in an intuitive way. JEOL JSM 5500LV also offers various image optimization parameters which enable the user to customize the images according to the requirements of the experiments. The built-in eddy-current detector allows for the alteration of image contrast in areas of interest. The Image Shift Correction feature allows for compensation of stage movement and drift, while the Resolution Enhancement mode allows for sharpening of images. Finally, JSM 5500LV is backed by JEOL Service Guide, providing free resources and software updates. The user can also select from a variety of optional accessories such as view screens and rotators to maximize the efficiency and performance of the SEM. With its features, JEOL JSM 5500LV is an easy-to-use, powerful scanning electron microscope, perfect for fast imaging and automation of nanoscale studies.
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