Used JEOL JSM 5500LV #293679583 for sale
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ID: 293679583
Vintage: 2001
Scanning Electron Microscope (SEM)
OXFORD Instrument
High vacuum mode
Low vacuum mode (1-130Pa)
SEI and BEI Detector
Modes: COMPO, TOPO, Shadow
LCD Display
2001 vintage.
JEOL JSM 5500LV scanning electron microscope (SEM) is a high-performance analytical tool designed for advanced imaging and microanalysis of a wide range of samples across various scientific disciplines. With a combination of cutting-edge features and user-friendly design, JSM 5500LV offers exceptional capabilities for detailed surface characterization at high magnifications and resolutions. At the heart of JEOL JSM 5500LV is its electron optical system, which includes a thermionic electron gun capable of generating a highly focused electron beam with energy levels ranging from 0.5 to 30 kV. This versatile electron source allows for precise control over the beam intensity and resolution, making it suitable for imaging both conductive and non-conductive samples without the need for extensive sample preparation. JSM 5500LV features a large chamber with a motorized stage that can accommodate samples of various sizes and shapes, providing flexibility for a wide range of applications. The stage can be controlled manually or through the intuitive software interface, allowing users to easily navigate and position samples for imaging and analysis. One of the key strengths of JEOL JSM 5500LV is its high-resolution imaging capabilities, with a maximum magnification of up to 300,000x and a resolution of 3 nm at 30 kV. This level of detail enables the visualization of fine surface features and nanostructures with exceptional clarity, making it well-suited for materials science, nanotechnology, and biological research. In addition to imaging, JSM 5500LV offers advanced analytical capabilities for elemental and chemical composition analysis through energy-dispersive X-ray spectroscopy (EDS) and wavelength-dispersive X-ray spectroscopy (WDS) systems. These detectors can be easily integrated with the SEM to provide valuable information on the elemental composition and distribution within the sample, enhancing the overall analytical capabilities of the instrument. JEOL JSM 5500LV is equipped with a comprehensive software package that allows users to control all aspects of the SEM operation, acquire and process images, perform elemental analysis, and generate comprehensive reports. The software interface is designed to be user-friendly and intuitive, enabling both novice and experienced users to operate the instrument effectively and efficiently. Overall, JSM 5500LV scanning electron microscope represents a state-of-the-art tool for high-resolution imaging and microanalysis, offering unparalleled performance and versatility for a wide range of scientific and industrial applications. With its advanced features, ease of use, and exceptional imaging capabilities, JEOL JSM 5500LV is a valuable asset for any laboratory or research facility seeking to push the boundaries of imaging and analysis at the micro and nanoscale.
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