Used JEOL JSM 5510 LV #293657551 for sale

JEOL JSM 5510 LV is a scanning electron microscope designed for imaging surfaces and features with unsurpassed resolution and magnifications up to 100,000x. This sophisticated instrument operates using both secondary and backscattered electrons which are produced by the interaction of the primary electron beam from its electron source with the sample under study. It is equipped with a high-resolution, digital display and an integrated imaging system for image capture and analysis. This Scanning Electron Microscope (SEM) has a large range of magnification, from 100x to 100,000x, as well as a range of working distances for specimen observation. It also boasts an energy dispersive X-ray detector that can be installed for compositional analysis of samples. JEOL JSM 5510LV is equipped with a cold field emission source (FES) which provides a greater range of electron beam currents and a quicker operation; this enhances the performance of the SEM and the resolution it can offer. A few advanced features of this SEM include automatic gain control - which increases the image quality by automatically adjusting the gain in the imaging chain -, laser navigation of sample control and an optional sample drift correction system. The unit is equipped with a large vacuum chamber and an integrated floating arm, which allows samples to be mounted and positioned in a wide range of directions and angles. This improves the specimen stability by conveniently absorbing vibration and shock during scanning, thereby minimizing sample movement and improving imaging results. JSM 5510 LV scanning electron microscope is a highly advanced tool used to investigate nanoscale materials, surfaces and structures. Its superior resolution and unique imaging capabilities make it a valuable asset in a variety of research and development fields.