Used JEOL JSM 5510 LV #9236006 for sale
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ID: 9236006
Vintage: 2002
Scanning Electron Microscope (SEM)
Operating system: Windows 2000
Electron beam type: W-Fillment
Manual backup
Resolution: 3.5 nm at 30 kV
Magnification: 18x (WD48 mm) - x300000 (136 steps)
Electron gun: Tungsten hair pin
Beam current: 1 pA - 10 nA
PC
LV Mode:
Resolution: 4.5 nm at 30 kV
Vaccum: 10-270 pA
Accelation voltages:
0.5 - 30 kV
0.5 - 3 kV (100 kV step)
3 - 30 kV (1 kV step)
Stages:
X Axis: 20 mm
Y Axis: 10 mm
Z Axis: 43 mm (WD5-48 mm)
Tilt Axis: 10±90
Rotation: 360°
Display:
LCD, 17"
SVGA
Monitor: IBM PC/AT
SDRAM: 64MB
Image output:
640 x 480
1280 x 960
Auto function:
Auto Contrast and Bright (ACB)
Auto focus
Auto stigma
Vacuum system:
Compressor: 1.0 MPa
Automatic control
Diffusion pump: 100 L / min
Pumping speed: 2min 30sec
Power supply: 100 VAC Single phase.
2002 vintage.
JEOL JEM 5510 is a scanning electron microscope (SEM) designed for a variety of applications and techniques in materials science and physical sciences research. This model utilizes a tungsten filament cathode in order to emit a beam of electrons that are accelerated towards a specimen. This allows for a high-resolution and high-throughput image of the sample. The specimen is placed in a vacuum environment to ensure that no air enters and interferes with the electron beam. JEM 5510 contains a dedicated vacuum system that is able to achieve pressure conditions of 5 x 10-7Torr. The high-definition electron beam is created via a 45kV tungsten filament cathode which can be adjusted in order to tune between high and low resolution images. Using JEOL JEM 5510's backscatter detector, images and movies can be captured of the specimen with resolution of down to 0.5nm. Additionally, this model features a high-dynamic range detector to capture even the slightest details of the specimen, down to an angstrom level. JEM 5510 is equipped with a motorized stage to allow for automated sample scanning. This allows for automated, point-to-point scanning of the specimen along the same plane with ease. The predefined sample holder holds a specimen up to a maximum of 8.5cm in diameter. For higher resolution imaging, JEOL JEM 5510 offers a secondary electron detector to provide higher contrast and a higher-resolution image. This detector is particularly useful in low-vacuum applications such as imaging a specimen with organic materials. In addition, the advanced design of the emission source prevents any external magnetic fields from interfering with the more delicate imaging requirements. The versatile design of JEM 5510 extends to its software capabilities. This model comes with a computer operated user interface which allows access to various imaging modes as well as data processing capabilities. Overall, JEOL JEM 5510 is a powerful scanning electron microscope that is perfect for both small scale and high-throughput imaging. With its strong build quality, advanced features, and impressive software capabilities, JEM 5510 offers tremendous value in its price range.
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