Used JEOL JSM 5510 #199715 for sale

JEOL JSM 5510 is a scanning electron microscope (SEM) that combines high performance, accuracy, and superior imaging capabilities to provide users with powerful little sample analysis. It can accurately perform high resolution imaging, analyzing elements, and sample analysis for a wide variety of samples and industries. JSM 5510 utilizes an advanced, high-frequency Cold Field Emission Gun (CFEG) source to create a highly focused electron beam of unparalleled accuracy. This enables lower operating voltages and therefore produces higher resolution images. JEOL JSM 5510 features a high collection angle detecting equipment for superior imaging capabilities. The system is capable of resolutions down to 3nm and the latest digital imaging technology to magnify the surface of samples up to 500,000 times. JSM 5510 offers an advanced control unit that incorporates Wi-Fi connection, auto-focus, over-sample speed optimization and easy operation modes. This allows for quick and easy tuning and operation of the device. In addition, JEOL JSM 5510 features an integrated stereo camera, enabling stereo depth analysis of the specimen. JSM 5510 also features an array of specialized accessories to enable high quality imaging across the widest range of materials and environments. These include a novel detector, EDS detectors, and a built-in contamination cleansing machine. JEOL JSM 5510 is both a practical and powerful tool for material research, analysis, line measurement, quantum operation, and more. In conclusion, JSM 5510 is a powerful, high-performing, SEM that combines advanced features, an array of specialized accessories, and accurate operation to deliver outstanding image results. Its low operating voltage, high collection angle detecting tool, and Wi-Fi connection all combine to make it an efficient and accurate instrument.