Used JEOL JSM 5510 #9151041 for sale

JEOL JSM 5510 is a high-end scanning electron microscope (SEM) that is used to analyze the composition, topography, and morphology of a wide range of materials. The microscope is designed for advanced characterization of morphology, crystallographic analysis, and elemental analysis. It delivers a large field of view - up to 10 cm x 10 cm at a magnification of 1,000 times the original size. It is equipped with a tungsten filament source for low voltage electron optics, providing an optimal balance of resolution, depth of focus, and sensitivity. At the heart of JSM 5510 is a magnetic lens, with either a 5 mm (B55) or 10 mm (C55) diameter. These lenses can be adjusted to provide either higher diffraction contrast or higher resolution. The lenses allow electrons to quickly and precisely focus to the specimen, providing unrivaled electron microscopy capabilities. In addition, the sample is surrounded by a powerful electrostatic lens to provide a detailed image without compromising spatial resolution or sample integrity. JEOL JSM 5510 is also capable of performing advanced analysis with its auto-specimen scanner, which digitally scans the sample with electrons in order to acquire and process data. The system includes a powerful image processor to analyze and interpret the data, creating images with high precision and clarity. The processor also has an auto-sampling feature, allowing researchers to accurately reproduce their experimental results. Moreover, JSM 5510 is equipped with an ultra-sensitive digital video system and a digital Multi-Format Camera. These systems combine to provide detailed imaging, allowing scientists to perform quantitative analysis on the images produced by the microscope. The images can be displayed in any number of formats, ranging from monochrome to 3D. Overall, JEOL JSM 5510 is a high-end, versatile scanning electron microscope that is capable of providing superior resolution, topography, and morphological analysis. It is designed to deliver unsurpassed performance in a range of applications, including material characterization, imaging, and elemental analysis.