Used JEOL JSM 5600 #293618709 for sale

JEOL JSM 5600 is a Scanning Electron Microscope (SEM) designed to run a wide variety of sample conditions and analysis techniques. It acquires digital images of up to 50,000x magnification at a resolution of 1.2 nm and can collect secondary electron or reflected electron signals. The SEM utilizes a conventional reflection/diffraction method in which the electrons are generated from an electron source, focused and incident onto the sample to create an image. The electron beam is shaped by parallel electric and magnetic fields to form an optimum density of electrons between the sample and the detector. The resolution of JEOL JSM-5600 is very precise, allowing for precise imaging of the sample surface down to the atomic level. The optics of the SEM is a specialized combination of lenses that help to provide images of the highest quality with low background noise. JSM 5600 utilizes a modular design that enables users to configure the system to their exact requirements. An optional stage adapter can be added as needed to accommodate a variety of sample holders and stages. The SEM is fully computer controlled, allowing users to set up experiments easily. The user can control the brightness, resolution, contrast, and display modes using a variety of software. The system includes a secondary electron detector for imaging, a backscattered electron detector for compositional or topographical analysis, an X-ray detector for elemental analysis, and an environmental controller for sample conditions. All of these detectors can be used in combination allowing for analysis of materials to a high degree of detail. JSM-5600 can be used for a variety of research and industrial applications such as crystal structure analysis, material research and analysis, surface analysis, bio-medical imaging, and semiconductor fabrications. Its powerful performance and versatile design make it an ideal tool for advanced research and analysis.