Used JEOL JSM 5600LV #293602477 for sale

JEOL JSM 5600LV scanning electron microscope (SEM), is an industry-leading imaging instrument that delivers unparalleled imaging capabilities in order to analyze and visualize the surface, morphology, and chemical composition of samples down to a resolution of 1nm. This model of SEM incorporates an advanced column design that provides an active compensation of sample displacement and delivers 1.2nm high-accuracy resolution with a fast scanning speed of up to 100um/s. The column also features a five-segment voltage divider that further improves spectral information capabilities. Moreover, the imaging abilities of JSM 5600LV benefit from a combination of two advanced detectors, which includes an Everhart-Thornley and a secondary electron detection detector. The everhart-thornley detector, due to its high dynamic range, is highly efficient at measuring higher levels of electron signals, while the secondary electron detector yields 3-dimensional topographical images with excellent sensitivity and excellent depth of focus. The incorporation of these two detectors allows JEOL JSM 5600LV to produce images that precisely depict and highlight the surface details of the samples. When scanning samples with JSM 5600LV, users can also benefit from its efficient ultra-low-vacuum inverter chamber design. This chamber design allows the sample to be rapidly examined under extremely low-vacuum conditions, without any outgassing or sample deterioration. Furthermore, the chamber includes an optimized diagonal stage that improves the mobility of the specimen and enables convenient and precise observation of the sample from various angles. To further optimize the analyzing and imaging capabilities of JEOL JSM 5600LV, users also have the option to incorporate any of its supplementary accessories. These accessories include an energy dispersive spectroscopy detector, an environmental chamber, and a gas cell. The energy-dispersive spectrometer (EDS) detector captures x-ray data in order to perform chemical analysis on the sample, while the environmental chamber mimics ambient air temperatures in order to get the most accurate imaging results. Additionally, the gas cell can be periodically filled with a noble gas in order to examine the sample in a closed environment. JSM 5600LV scanning electron microscope is a state-of-the-art imaging instrument that combines a powerful column design, precise detectors, and advanced accessories to deliver precise and reliable imaging capabilities. With its industry-leading imaging capabilities and its wide range of accompanying options, JEOL JSM 5600LV is the perfect choice for laboratory and research settings.