Used JEOL JSM 5600LV #293648302 for sale

JEOL JSM 5600LV Scanning Electron Microscope (SEM) is a powerful tool for imaging, elemental composition,and 3D analysis of a range of sample materials. It features advanced electron optics and an uncertainty resolution superior to those of conventional SEMs, resulting in high resolution images. The simultaneous acquisition of multiple images is also possible. In addition, the 2-axis goniometer makes adjusting the specimen orientation quick and easy. JSM 5600LV features a secondary electron detector with 3D imaging capabilities including digital shadow imaging and a field emission gun to optimize focus adjustment. Additionally, the secondary electron detector can be combined with an energy-dispersive X-ray detector to produce imaging and elemental composition measurements. JEOL JSM 5600LV also offers automated image processing and intuitive user interfaces. Automated image processing functions include contrast adjustment, edge sharpening, defect exaggeration and correction, and movement compensation. The intuitive user interfaces enable easy parameter selection and simplified specimen manipulation including the ability to assign labels, colors, and symbols to specific locations. Furthermore, a wide variety of imaging and analysis tools is available, from high throughput driftless imaging to data manipulation and analysis. JSM 5600LV features an advanced high resolution mode for imaging small samples or detecting ultra-low contrast features. This mode enhances image resolution and renders an image with higher contrast even when observed with low accelerating voltage. The low accelerating voltage mode also reduces the X-ray emission from the specimen, eliminating the need for a lead shield. Additionally, the scanning electron microscope is equipped with a range of sample holders for different specimen sizes and shapes, including specimens mounted on conductive pins for easy manipulation. JEOL JSM 5600LV offers automated particle and volume measurement capabilities, enabling precise and reliable quantitative analysis. It is capable of measuring particles up to 100 nanometers in size and enables comparison of particles between samples or different points within the sample. The dynamic range of JSM 5600LV extends up to 11 billion counts per second, allowing precise measurement of low contrast features. Additionally, it offers the capability to measure physical properties of the sample including heights and widths, phase change, and localized surface potential. Finally, JEOL JSM 5600LV is perfectly suited for imaging of nanostructure morphologies, as well as for scanning through thick specimens. It is a highly versatile and easy to use microscopy solution for a variety of applications, from materials science to life science.