Used JEOL JSM 5600LV #9243690 for sale

JEOL JSM 5600LV is a scanning electron microscope (SEM) that is fit for versatile materials and imaging science studies. It is an ultra high-resolution, low voltage SEM with low vacuum operation and an integrated system optimized for in situ studies. JSM 5600LV boasts a fully integrated environmental system designed for materials and imaging science experiments. It features an environmental chamber with independent control of the pressure, temperature and gas. This lets the user modify the environment and atmosphere around the sample, ideal for investigations of materials in their natural environment. JEOL JSM 5600LV enables users to observe samples with higher contrast and resolution, thanks to its low voltage capability and small spot beam. This can cut down the time of analysis and image acquisition, particularly of processes that are highly temperature-sensitive. It also features an integrated, state-of-the-art detector system, which includes two types of detectors: a secondary electron detector (SED) and an imaging detector. JSM 5600LV also has a secondary electron detector (SED) that can be used to acquire the signal and image contrast, and the detector has a wide dynamic range and is capable of delivering high signal-to-noise ratio images. The imaging detector includes an Everhart-Thornley (ET) SE detector, an ETB detector, and a Schottky Field Emission (FE) detector. Overall, JEOL JSM 5600LV is an impressive SEM, ideal for observing materials and imaging science. It has an excellent combination of versatility and accessories for in situ and operating environment tests, with its low voltage capability, small spot beam and integrated detector systems. This makes JSM 5600LV well-suited for a variety of applications, from materials research to imaging experiments.