Used JEOL JSM 5600LV #9314114 for sale

JEOL JSM 5600LV is a premium scanning electron microscope (SEM) designed for imaging, analysis, and characterization of samples with resolutions in the sub-angstrom level. The instrument is equipped with a high voltage electrostatic lens and high-performance low voltage camera. The design features a variable-pressure chamber, which can operate in both low and high vacuum modes. This allows for imaging and specimen analysis under extreme conditions, giving the user control over optimum imaging conditions at high lateral resolution. The instrument is also equipped with a four-quadrant, four-channel Czerny-Turner monochromator. This tool allows for imaging with a variety of electromagnetic signals, from the ultraviolet to the infrared, enabling a variety of analytical types. The beam power and intensity can be adjusted to a precision of one percent. There is also a three-channel electron energy analyzer, which can measure the wavelength of the electron beam and identify the composition of the sample. The sample chamber has motorized sample movement for easy specimen loading and precise positioning of the sample. It is equipped with a high acceleration power supply for rapid scanning and a short scan time. JSM 5600LV is capable of both high resolution imaging and high-speed imaging. The system has a broad range of imaging capabilities, including Sampled All-Round (SAR) field of view and 3-Dimensional (3D) imaging. JEOL JSM 5600LV scanning electron microscope is also equipped with a vacuum system and an Ion Beam Deposition Unit (IBDU). The IBDU allows the user to prepare and deposit functional thin films, such as oxide layers and metallic or non-metallic coatings. It can also be used to create polymers, semiconductors, and other material surfaces. Additionally, it can deposit and pattern transparent conductive coatings such as indium tin oxide (ITO). The instrument offers advanced analytical tools such as X-Ray Analysis, Particle Analysis, Reverse Engineering, and 3D Reconstruction. This enables a wide range of applications, from materials research to failure analysis and reverse engineering. It is also an ideal tool for quantitative characterization of surfaces and bulk materials, ensuring reliable data for accurate interpretation. Overall, JSM 5600LV is an advanced scanning electron microscope designed for optimal imaging and analysis, even under extreme conditions. It offers a range of analytical and characterization capabilities to enable a variety of applications and research purposes.