Used JEOL JSM 5610 #9386138 for sale

JEOL JSM 5610 is a scanning electron microscope (SEM) designed for advanced imaging solutions and precision analysis for scientists in the field of materials science, toxicology, semiconductor engineering, and more. JEOL JSM-5610 features a patented tungsten filaments cathode electron gun with a wide range of accelerating voltages, making it suitable for various analytical applications. It also includes an automatic objective lens selector, allowing scientists to quickly switch from low- to high-magnification imaging. The SEM is equipped with a dedicated three-axis motorized stage that moves the sample along an x-y-z plane for positioning and orientation. JSM 5610 utilizes a high-powered 10x-1000x variable-magnification objective lens that can focus on microscopic details with an image resolution of 0.5 nanometers (nm). An integrated environmental coling system keeps the sample and lens cool during operation, and a double-tilt mechanism allows the lens to be turned either horizontally or vertically for improved image detail. JSM-5610's in-column closed-cycle HV and temperature stabilization system ensures accurate and stable operability for longer periods of time, while its powerful secondary electrons (SEI) detector produces vivid images with a soft ferromagnetic core and cryogenics device for increased cooling. Additionally, the SEM features a low- or high-voltage detector, as well as detectors for energy-dispersive X-ray spectroscopy (EDS) and electron back-scatter diffraction (EBSD). Furthermore, its one-touch automatic operations make the scanning electron microscope idealy suited for fast and efficient use in high-volume environments. JEOL JSM 5610 has various software and PC-based analyzation programs available, enabling users to analyze data from a variety of sample types. This makes the microscope a reliable tool for quality control of materials used in microelectronic, biotechnology, and pharmaceutical industries.