Used JEOL JSM 5610LV #9259734 for sale

JEOL JSM 5610LV is a scanning electron microscope (SEM) that utilizes a variable pressure system to allow for high resolution images of small samples. The instrument enables the user to view specimens at different levels of magnification and resolution and also offers a low voltage range (35-2,000 V) that adds to its versatility. For high resolution imaging, the microscope is equipped with an Oxford Instruments IX35 X-MAXN energy dispersive X-ray detector that provides almost instantaneous elemental mapping and energy-filtered imaging of samples. It has an integrated stage tilt specification of +30/-30° and a stage length of 80mm. Additionally, the instrument is designed to allow for easy maintenance and operator access. In terms of imaging capabilities, JSM 5610LV is capable of producing imaging resolutions of 1nm with a 5nm field of view in the secondary electron (SE). Furthermore, it is capable of providing imaging resolutions of between 5-10nm with a 14nm field of view in the backscattered electron (BSE) mode. In addition to the image acquisition, the microscope also provides automated feature recognition for particle identification and particle counting tasks. The instrument be operated with both an Ethernet connection and stand-alone system mode, allowing the user to adjust various parameters such as voltage, dwell time, display brightness, and contrast. Furthermore, the user can set up automated imaging protocols with the automated image acquisition and control software. This software also provides options for flexible post-processing which allows users to manipulate data and export images for review. Overall, JEOL JSM 5610LV is a powerful and versatile SEM that can offer high resolution imaging and a wide range of imaging capabilities. In addition, its various features make it suitable for a variety of applications such as materials analysis, research, and quality control.