Used JEOL JSM 5800 #9189494 for sale

JEOL JSM 5800 Scanning Electron Microscope (SEM) is a high-performing and versatile analytical tool designed for imaging and elemental analysis. It features a powerful high-fidelity field emission electron source, which makes it highly sensitive to differences in specimen morphological detail. It has a maximum accelerating voltage of 30 kV and a maximum probe current of up to 100 nA. JEOL JSM-5800 also comes with a comprehensive range of user-friendly software packages, including JEOL LaB6 measurement, which provides accurate measurements of both topography and compositional information. The microscope's main optical equipment consists of two movable elements, which creates a parallel beam of electrons from the source to the specimen. The diagonal symmetry of its electron optics provides an improved image resolution and a larger field of view. Its adjustable beam diameter can range from 1-500 nanometers and it can be used to identity even the smallest differences in material composition. Its secondary electron detector can distinguish between materials with differing atomic numbers, making it perfect for identifying elements within a sample. The advanced design of JSM 5800 allows users to select and switch between multiple detector systems, optimizing analysis of samples with a range of characteristics. Its core-shell detector system is able to detect both secondary and backscattered electrons. The microscope also comes with the new MicroChemical Analysis Unit, which allows for semi-automated chemical analysis, with resolution as low as 1 μm. JSM-5800 comes with a highly sensitive energy-dispersive X-ray detector that can be used for elemental analysis. The built-in imaging filters also allow for increased contrast between different microscopy images. Finally, the machine's automated sample stage and computer control automation provide fast and precise sample positioning, complementing the microscope's high resolution imaging capabilities.