Used JEOL JSM 5800 #9219589 for sale

JEOL JSM 5800 is a scanning electron microscope (SEM) designed to provide high resolution imaging and material analysis. It uses an electron beam to create an image by detecting secondary electrons or backscattered electrons (BSE) emitted by the sample. The high resolution imaging capabilities of the SEM enable observation of various morphologies, structures, and even the elemental composition of a sample. JEOL JSM-5800 is equipped with a 5-meter variable pressure chamber, allowing users to observe samples in a range of particle densities. The low temperature electron source prevents sample damage while retaining image clarity and resolution. JSM 5800 is equipped with an advanced electron optics system which includes a pre-field and a field correction coil, an aperture coherence, and a pre-gas condenser lens. These components help improve image resolution and contrast. The system also features an in-lens detector which allows for energy-dispersive X-ray (EDX) analysis. This allows users to evaluate sample composition. JSM 5800 has an automated focus feature which aids in conducting fast and accurate measurements when observing a sample with variable composition or topography. An in-column energy filter, controlled by a digital microprocessor, helps reduce false image signals that may occur due to double scattering and beam contamination.This feature can also be used to obtain a high-contrast image of a thin or flat sample. JEOL JSM 5800 is also equipped with various imaging modes intended to analyze the shape, composition, and electrical properties of a sample. Its bright and dark field imaging mode uses a 'signal-neutral' value to detect a sample's topographic features. The Enlargement Image Analysis software comes with the microscope, allowing for quantitative analysis of an image's pixels. In conclusion, JSM-5800 Scanning Electron Microscope is an advanced piece of equipment that is capable of providing high resolution images, analyzing morphological features, and providing elemental compositions of a sample. The versatility and easy operability of the microscope makes it a useful tool for many applications, especially in material science research.