Used JEOL JSM 5800 #9234123 for sale

JEOL JSM 5800 scanning electron microscope (SEM) is a versatile and powerful tool for imaging and characterizing various materials, specimens and structures. JEOL JSM-5800 offers a wide field of view, with a maximum magnification of 200,000x, allowing users to see the finest details of their specimens. The microscope is equipped with a high-resolution ultra-long working distance objective lens, providing a sharper focus than traditional SEMs. High-sensitivity detectors, including a silicon drift detector (SDD) and secondary electron detector (SED), make it possible to accurately detect trace elements and features on the sample surface. JSM 5800 also provides superior depth perception with its variable pressure and low voltage imaging capabilities, giving users a clearer understanding of the samples they are studying. An intuitive navigation system allows users to easily navigate the microscope's various settings and functions. JSM 5800 features a high speed 12-bit digital image capture card, making image capture easy and efficient. It also contains an advanced software package that makes controlling the instrument and analyzing data easier than ever. JEOL JSM 5800's specialized X-ray microanalysis system provides users with a unique way to identify and characterize different elements in their samples. The X-ray microanalysis capabilities of the microscope make it possible to identify material composition and measure composition depth. Finally, JSM-5800 is user friendly and easy to operate. Its ergonomic design and intuitive user interface enable users to quickly learn and become comfortable with its functions and features. This ensures that users can get the most out of JEOL JSM 5800 and acquire the best possible results when working with it.