Used JEOL JSM 5800 #9393561 for sale
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ID: 9393561
Vintage: 1996
Scanning Electron Microscope (SEM)
IXRF 550i EDS
SEM Keyboard
Joystick driven stage
Diffusion and roughing pumps
Qual and quant ED programs
Digital imaging and line scanning
Elemental dot mapping
Phase analysis
Cathodes: Lab6 with filament
Imaging detectors: SEI and BEI
PC
Operating system: Windows
Stage: Large chamber with port
Current: Maximum 30 A
Power: Maximum 3.0 kVA
Frequency: 50/60 Hz
Starting current: Maximum 70 A
Ground resistance: Maximum 100 Ω
Voltage: 100 ±10V
1996 vintage.
JEOL JSM 5800 is a scanning electron microscope (SEM) designed with both the industrial and life science researchers in mind. It features advanced imaging capabilities for both standard surface topography and high resolution imaging, allowing for accurate imaging of samples down to nanometer scales. The instrument includes a number of advanced features, such as an ultra-sensitive electron detector, an ever-ready column, digital image processing, film recording, and video and digital image storage. JEOL JSM-5800 is designed with a range of advanced imaging capabilities, including that of digital contrast images, true three-dimensional imaging, and secondary electron imaging. These imaging capabilities are supported using a powerful electron gun, capable of producing voltage outputs of 3-200KV, as well as a wide range of digital imaging modes and software packages. The instrument also has the ability to rotate the sample 360°, enabling the user to obtain detailed images from the different angles and sides of the sample. JSM 5800 also features an ever-ready column and an environmental scanning electron-beam that is capable of operating in harsh environments, enabling for a range of industrial applications. For life science researchers, JEOL JSM 5800 includes an integration with a range of accessories, including cold cathode ion detectors and ultra high-vacuum systems. This allows for a wide range of imaging techniques, such as differential contrast images, elemental mapping, and automated FIB-SEM (focused ion beam scanning electron microscopy). JSM-5800 is an easy to use instrument, featuring a multifunctional control system and user-friendly touch screen that allows for fast and efficient operation. This system allows the user to quickly access desired functions and manipulate the scanned images. In addition, the instrument includes a range of post-processing and analysis applications, as well as video and digital image storage, making it ideal for both industrial and scientific applications. Overall, JSM 5800 is an advanced scanning electron microscope that offers a range of features, from advanced imaging capabilities to an easy to use multifunctional control system and environmental scanning capability. The combination of these features makes the instrument suitable for a wide range of industrial and scientific applications.
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