Used JEOL JSM 5800LV #293586819 for sale

JEOL JSM 5800LV is an advanced scanning electron microscope (SEM) that provides high resolution imaging capabilities for materials science and solid-state electronics applications. It is equipped with a high-resolution field-emission electron source and a cold probe sample holder that allows for extremely low sample temperatures for improved resolution. The high-energy electron beam of JEOL JSM 5800 LV enables high throughput imaging of a wide variety of materials. It has a large depth of field and can image structural features from the nano-scale to the micro-scale. JSM 5800LV features a large vacuum chamber that is designed to accommodate samples of up to 175 mm in diameter or larger with the optional size envelope. It is equipped with a dual TV camera equipment for fine focus and magnification control that is connected to a monitor for easy viewing of images. Additionally, the large chamber allows for up to three samples to be imaged at the same time with an overlay function. JSM 5800 LV also comes with an integrated data acquisition and analysis system, which enables electron microscope images to be recorded and analyzed in real time. The unit includes a powerful image analysis machine, which allows for automated image processing, data analysis, and quantitative measurements. The integrated tool also features special software for 3D reconstruction of sample images and diffraction data. JSM 5800LV is a versatile SEM that has been designed to provide high-resolution imaging capabilities for materials science and solid-state electronic applications. Its combination of advanced hardware and software allow users to obtain high-resolution images of materials and devices at the nanoscale level. From an operational standpoint, the large vacuum chamber and integrated data acquisition/analysis asset make it an efficient and reliable tool. Additionally, the low-temperature probe sample holder enables users to image a wide variety of materials at very high resolutions, which is essential for many materials science applications.