Used JEOL JSM 5800LV #293760985 for sale

JEOL JSM 5800LV Scanning Electron Microscope (SEM) is a powerful, reliable instrument used for a range of scientific explorations. It is a high-performance device that is suitable for a variety of materials including polymers, ceramics, metals, and semiconductors. It is especially well suited for detecting the surface structures of materials with submicron or even nanometer resolution. JEOL JSM 5800 LV is equipped with a range of features and functions to offer the user the best level of performance. Firstly, it has a variable pressure equipment to prevent sample damage due to electrons interacting with the atmosphere during operation. Secondly, it features an advanced electron detection system, known as Backscattered Detection Unit (BDS), which allows a wide dynamic range of up to two orders of magnitude. This machine also enables the digital imaging of any sample, due to its sensitivity. The SEM scanner of JSM 5800LV also allows ease of operation and provides excellent image resolution. Its beam acceleration voltages are optimized at 1.5kV and 2.5kV and its scanning range covers up to 45kV, with a maximum resolution of 1.3nm (0.13µm). Its stage is motorized and features a moveable sample holder, allowing for quick and easy movements along the x, y, and z axis. The energy dispersive spectroscopy (EDS) tool of JSM 5800 LV allows for elemental analysis of samples. It enables the user to collect a spectrum from the whole sample, as well as point mapping. Furthermore, the device offers wide variety of image corrections that are meant to enhance contrast, brightness, and sampling depth of the image. In addition, JSM 5800LV is designed with safety considerations in mind. Its x-ray detection asset and ion protection mechanism alert the user in the case of any danger. Its recycling model also prevents the sample from being damaged by not only high acceleration voltage, but also highly energetic electron beams. All in all, JEOL JSM 5800LV Scanning Electron Microscope is a powerful and reliable tool for researching a variety of materials. It is equipped with multiple features to offer great performance and image resolution, as well as safety features to protect the sample and user from radiation. It is especially suitable for imaging surface structures down to the nanometer level.