Used JEOL JSM 5800LV #9255669 for sale

JEOL JSM 5800LV is a high resolution scanning electron microscope (SEM) equipment designed for use in various scientific research and industrial applications such as microanalysis, imaging, and failure analysis. This SEM has a field emission gun (FEG) electron source, which generates faster and higher resolution images than traditional thermal emission electron sources. It also has a long working distance, which enables it to focus accurately on areas that are further away. JEOL JSM 5800 LV offers high resolution imaging, up to 0.8 nm and high resolution analytical data with an excellent signal-to-noise ratio. It also provides an excellent field of view, large enough for observation of large samples. Its variable pressure chamber allows for operation in both high vacuum and low vacuum modes, making it suitable for a variety of applications. JSM 5800LV also has a high rate of speed, enabling it to process images faster than other SEMs. The data is typically processed by a combination of several techniques including secondary electron imaging (SEI), backscattered electron imaging (BSEI), or cathodoluminescence (CL). It is also capable of image stitching for larger area samples. The system is fitted with an automated navigation and alignment unit that makes sample preparation quick and easy. This machine also helps to reduce sample contamination and facilitate accurate positioning of the sample. The sample can be scanned with the automated navigate alignment tool, and then the manual scan control panel can be used to fine-tune the scan settings. JSM 5800 LV also has a built-in vacuum asset, which is capable of maintaining the desired level of vacuum. In addition, the SEM model is also integrated with an energy dispersive X-ray microanalysis (EDXA) and an electron backscatter diffraction (EBSD) equipment, allowing users to analyse the material composition of their samples in detail. Overall, JSM 5800LV is a powerful and advanced scanning electron microscope designed for a variety of applications. It offers exceptional resolution, speed, and automated navigation and alignment features. Its integrated energy dispersive X-ray microanalysis (EDXA) and electron backscatter diffraction (EBSD) systems make it suitable for materials analysis. It is perfect for a range of research and industrial applications and is a valuable tool for any laboratory.