Used JEOL JSM-5800VP #9096225 for sale

JEOL JSM-5800VP is a scanning electron microscope (SEM) with a unique configuration that makes it particularly well-suited for a variety of scientific and engineering applications. This powerful microscope combines advanced electron optics and image acquisition technologies with a highly versatile electron accelerator. A wide range of imaging capabilities are available on JSM-5800VP including conventional and high resolution, secondary (scanning transmission) electron microscopy, and low voltage backscattered electron imaging. The dynamic range of this microscope is able to resolve features as small as 0.5 nm and as large as 25 µm, while the main lenses designed specifically for backscatter imaging, have a minimum resolution of 4 nm and a maximum objective magnification of up to 600,000x. The microscope utilizes the latest in hardware and software to provide users with an easily navigable user interface. This includes a user-friendly display system, with an intuitive design, as well as advanced software and hardware control systems, for making accurate adjustments and measurements. Furthermore, JEOL JSM-5800VP utilizes a fast switching filament so that a wide range of imaging conditions can be achieved in seconds. The acceleration voltage of JSM-5800VP is adjustable between 0.1 and 30kV, making it capable of producing high-contrast images, from nanoscale samples, with excellent resolution. Furthermore, the design incorporates an advanced aberration (Aberration Corrector) and a Chrome on Molybdenum (C Mo) scatterless image transfer system. JEOL JSM-5800VP is capable of a variety of image manipulation capabilities, making it perfect for a wide range of research and industrial applications. This includes stitching multi-panel images, creating cross-sectional and broken line drawings, and producing particle size diagrams. In conclusion, JSM-5800VP is an advanced scanning electron microscope that offers powerful imaging capabilities, with a maximum magnification of up to 600,000x and a minimum resolution of 0.5nm. Its advanced hardware and software features make it well-suited for the widest range of research and industrial applications.