Used JEOL JSM 5900 #9079567 for sale

JEOL JSM 5900 is a scanning electron microscope (SEM) offering highly detailed imaging. It offers high resolution imaging from 5 nm to 1.2 µm and secondary electron imaging from 20 nm to 5 µm. It is equipped with a Schottky electron gun for highly detailed imaging, a tensioned aperture for improved brightness and energy resolution, an auto-focusing optical column, and a 10 mm 2 sample stage. JEOL JSM-5900 also includes a unique contribution in comparison to other microscopes as it contains a heating stage with an adjustable temperature range from -159°C to 600°C. With this temperature range, it is suitable for the imaging of both organic and inorganic samples. JSM 5900 provides a wide range of features including the ability to detect optical, thermal, topographical and mechanical properties. The thermal analysis allows the user to access the morphological features of a sample without the need for additional specialized analysis. In addition to its imaging capabilities, JSM-5900 also contains several peripheral systems that can be used to carry out additional experiments. These include an electron beam lithography equipment, a focused ion beam system, and a dedicated microanalysis unit. Additionally, JEOL JSM 5900 is equipped with various safety and environmental systems, such as an environmental control machine and an automated chamber cleaning tool, allowing for safe and stress-free experiments. JEOL JSM-5900 is a powerful and accurate scanning electron microscope perfect for applications such as nano-scale metrology, failure analysis, imaging biological samples, and more. With its wide range of features and systems, this SEM is ideal for projects that require highly detailed imaging and analysis.