Used JEOL JSM 5900 #9102873 for sale

JEOL JSM 5900 is an advanced scanning electron microscope (SEM) designed for high-resolution imaging and measurement of a variety of samples. It utilizes a tungsten-filament electron gun, as well as a field emission gun, for excellent electron probe magnification. Its design also enables it to take images in multiple channels of information at high resolutions. JEOL JSM-5900 features a large, 5,000 mm working distance, providing the ability to analyze and analyze large samples with a wide field of view. It supports a range of magnification from 0.7 nanometer to 30 mm, and also is capable of performing three-dimensional imaging and quantitative analysis. Moreover, its in-lens video and secondary electron imaging systems greatly enhance the imaging detail and resolution. JSM 5900's high-performance detectors allow for simultaneous collection of both secondary and backscattered electrons. This provides superior topographic detail of the sample. It also features a range of detectors, such as photomultiplier tubes (PMT), channel electron multipliers (CEM), and energy dispersive (EDX) systems that facilitate detailed analyses of the chemical composition of specimens. JSM-5900 is also fitted with JEOL Observation Control Tool (JOCT), which provides an easy-to-use interface for advanced SEM operations. It enables the collection of large number of imaging channels, as well as the processing and analysis of both the images and spectra from EDX/WDS system. Additionally, the system is equipped with automation capabilities such as automatic alignment and sample film thickness measurements. Overall, JEOL JSM 5900 is a powerful scanning electron microscope that provides optimal imaging and analysis capabilities. Its user-friendly JOCT interface simplifies operating the device, while its multiple detectors and automated functions make it the optimal choice for high resolution, advanced imaging needs of the laboratory.