Used JEOL JSM 5900LV #293665576 for sale

JEOL JSM 5900LV is a scanning electron microscope (SEM) used for imaging surfaces and other microscopic features with high accuracy and resolution. It works by using a focused beam of electrons to scan the surface of a sample in order to generate an image. The electron beam in JEOL JSM-5900LV is generated through a tungsten filament heated by an electron gun and then focused using electrostatic lenses. The electrons are then accelerated to a high energy level and directed down towards the sample at an angle. As the beam scans the sample surface, the electrons interact with the material and cause a cascade of secondary electrons to be released. These electrons are then collected and detected, and the resulting signal is used to generate an image of the sample surface. JSM 5900 LV is capable of providing high resolution images and is highly efficient at collecting data related to the topography, elemental composition and defects in the sample. It also features a large field of view of up to 50mm, allowing for imaging of large sample areas. JEOL JSM 5900 LV also has a large depth of field, enabling it to acquire images of features at varying depths with a single scan. This is made possible by the use of an adjustable focus and a secondary electron detector. JSM 5900LV also includes a state-of-the-art low vacuum scanning equipment which is capable of imaging samples without the need for any additional coating. This ensures that the data obtained is of the highest quality and is free from artifacts caused by coating materials. The low vacuum system also minimises sample damage due to electron exposure, making it suitable for imaging delicate samples. The instrument includes an automatic focus compensation unit which adjusts the focus for various depths of field and an automatic image capture machine which stores images onto a digital memory card. The instrument also includes an integrated sample manipulation tool which allows for precise sample positioning and a control console which enables control of the instrument from a remote location. To ensure optimal performance, JSM-5900LV is equipped with a set of powerful software packages which can be used for image acquisition, image processing, analysis and data storage. The software can be customised to meet the requirements of the user and includes features such as image stitching, line profiling and particle size analysis. In conclusion, JEOL JSM 5900LV is a powerful and versatile scanning electron microscope which is capable of providing high resolution images of surfaces and other features with a high accuracy and efficiency. The integrated low vacuum scanning asset, state-of-the-art software packages and automated focus compensation and image capture model make it an ideal choice for a range of imaging and sample analysis applications.