Used JEOL JSM 5900LV #9123096 for sale

JEOL JSM 5900LV is an industry-grade scanning electron microscope (SEM) renowned for its versatility and performance. It uses a dedicated column and high-detail imaging capabilities to produce high-resolution images and analysis of surfaces down to the nanoscale. With the advanced capabilities of JEOL JSM-5900LV, users can achieve a range of imaging techniques, including reflectance imaging, backscattering electron (BSE) imaging, secondary electron (SE) imaging, and compositionally specific imaging. JSM 5900 LV is equipped with an ultra-high vacuum chamber, four-axis stage, and auto lens alignment, making it an excellent choice for a variety of applications, including materials analysis, failure analysis, circuit research, and process control. JSM-5900LV's imaging capabilities are remarkable. Through the combination of field and optical magnifications, resolution can easily reach up to 200 nanometers (nm) for SE imaging, and go up to 400 nm resolution in BSE imaging. The innovative "auto backscatter imaging" function allows users to capture images with great contrast and fidelity. It also features a unique "voxel imaging" capability, which acquires up to three images simultaneously from different angles. This enables users to build three-dimensional models quickly and accurately. JEOL JSM 5900 LV also features a "variable pressure" mode, which allows researchers to study materials with greater depth by scanning samples while controlling the atmosphere in the chamber. This mode eliminates the need for additional environmental insulation and enables researchers to analyze samples in their own unique environment. The advanced analysis capabilities of JSM 5900LV make it a powerful tool for studying samples at the nanoscale. It offers a high-speed image processing interface (HIPI) with an intuitive touch-screen user interface, allowing users to quickly and accurately analyze specimens with a minimal learning curve. JEOL JSM 5900LV also includes software packages for chemical analysis, particle size analysis, crystal structure analysis, 3D tomography, and digital micrography. The versatile and robust design of JEOL JSM-5900LV makes it an ideal choice for laboratories engaging in research and development. The combination of its high-resolution imaging and advanced analysis capabilities make it the perfect instrument for exploring complex systems and structures down to the nanoscale. In short, JSM 5900 LV is the perfect tool for laboratory professionals seeking a reliable, versatile, and powerful scanning electron microscope.