Used JEOL JSM 5900LV #9239975 for sale

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ID: 9239975
Vintage: 1998
Scanning Electron Microscope (SEM) EDAX EDS Detector 1998 vintage.
JEOL JSM 5900LV scanning electron microscope is a high-performance imaging device with a field emission electron gun, an advanced automation equipment and various imaging modes for optimal imaging of a wide range of specimens. It features a robust workflow, with a large10 kV - 30 kV variable accelerating voltage, its high brightness field emission electron source and the high-resolution digital imaging system for outstanding image clarity. The accelerated voltage is variable, with its high acceleration voltage it is suitable for imaging specimens that are prone to charging. In order to provide superior vibration stability and imaging resolution, the unit utilizes a high-performance imaging machine with specialized aberration-corrected lenses. The aberration corrected lenses help correct for aberrations that arise due to the optical properties of the lenses, which can result in blurriness and distortion in the image. The electron gun uses a tungsten filament structure with a lifetime of up to 3000 hours, which results in a wide field-of-view for imaging and improved imaging contrast. In addition, the detector can be hydrocarbon-free, thus avoiding any of the risks associated with hydrocarbon damage to samples such as staining or chemical alteration. The tool features automated operations with an open user interface to facilitate operation and provide improved imaging. The automated stage traversing combined with its automated specimen preparation helps ensure that the workflow is consistently reliable. In order to optimize the imaging process, JEOL JSM-5900LV has various imaging modes such as high-magnification detection, secondary electron imaging and backscattered electron imaging. The combination of the various imaging modes, with their associated settings and parameters, provides control over the type of images desired. The software also offers functions for generating 3D images from series of images and for creating montage images. JSM 5900 LV achieves excellent imaging through advanced automation and imaging capabilities combined with its robust hardware. The effects of electron beam irradiation are reduced and the risk of hydrocarbon damage is eliminated, resulting in superior imaging results and optimal performance. The advanced imaging capabilities and automated functions make this asset an ideal choice for imaging a wide range of specimens.
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