Used JEOL JSM 5900LV #9314353 for sale

JEOL JSM 5900LV is a scanning electron microscope (SEM) that is designed for applications in materials science, life science, and industrial inspection. It is a high resolution, low vacuum (LV) SEM that is capable of imaging a variety of samples sizes and shapes, from the nanometer to millimeter scale. JEOL JSM-5900LV is equipped with an in-lens type high-performance electron gun with a dual gun system. The beam current range of 0.1 pA to 15 nA enables high resolution imaging and elemental analysis with EDX ElementComp. It is also equipped with a field emission gun for extended vacuum operation that provides high-sensitivity imaging and EDS ElementalComp. JSM 5900 LV has an impressive Magnification Range of 15x to 1,000,000x, allowing for imaging from the sub-nm up to 60,000 times the original size. It is also sophisticated enough to employ a variety of Imaging Modes, including secondary electron (SE), backscattered electron (BSE), in-lens secondary electron (ISEL), and high-resolution stereo imaging (MP). With its high-definition imaging and optional in-lens type ImageMatch System for pattern recognition, users are able to detect minute features in the sample. In addition, JSM-5900LV is equipped with a wide range of detectors and digital imaging capabilities for both energy dispersive X-ray spectroscopy (EDX/ElementComp) and analytical scanning transmission electron microscopy (ASTM). EDX is used for qualitative and quantitative chemical analysis, while ASTM can be used for imaging of location and composition distributions in the sample. JSM 5900LV is also capable of simultaneous SEM imaging and EDX ElementComp analysis, making sample characterization easier and faster. With its versatile imaging capabilities, JEOL JSM 5900 LV is well-suited for a wide variety of materials science, life science, and industrial applications. This SEM is capable of imaging various samples, such as PCBs, metals, ceramics, composites, carbon nanotubes, and small biological specimens. Its high resolution imaging enables users to examine specimens in detail and make precise measurements. JEOL JSM 5900LV provides users with an advanced and reliable scanning electron microscope for imaging of a wide range of material samples.