Used JEOL JSM 5910 #9362883 for sale

JEOL JSM 5910 is an advanced scanning electron microscope (SEM). This device is specifically designed for detailed imaging of specimen surfaces at very high magnifications under high vacuum conditions. It utilizes a tungsten filament electron source to enable the use of both a secondary electron detector (SED) and a backscatter electron detector (BSD). The SEM is equipped with a variable-pressure chamber specifically designed for low vacuum imaging, which allows for imaging of delicate, non-conductive materials. It houses a 5-axis precision specimen stage that enables tilt scanning and enables the rotational and translational positioning of the specimen via 12mm of travel. This stage also allows for automated area and line scanning. JSM 5910's electron source is capable of generating beams with energies up to 30kV and adjustable currents up to 8µA. Beam diameter on the specimen can be as small as 10nm. The system is equipped with an in-lens gun detection and alignment system that enables rapid alignment of the electron gun relative to the specimen. This SEM is also outfitted with a variety of detectors, including an SE Detector, a BS Detector, a BSE Detector, a Double Gold-coated SE Detector, and a Super-Conductive Wavelength Dispersive X-Ray Detector. These detectors enable a variety of imaging modes, including backscatter imaging, topographic imaging, conventional-beam microanalysis, and Energy Dispersive X-Ray (EDX) spectroscopy. JEOL JSM 5910 is operated with a user-friendly, Windows-supported software package that provides complete control of the SEM's functions. This software package includes an image processing section for image enhancement before or after image acquisition. JSM 5910 is a powerful and versatile tool for high resolution imaging and elemental composition analysis of a variety of materials. With its advanced electron optics, detectors, and comprehensive software package, JEOL JSM 5910 is the ideal choice for imaging and analysis of a variety of surfaces.