Used JEOL JSM 5910LV #9203901 for sale

JEOL JSM 5910LV is a scanning electron microscope (SEM) capable of high-resolution imaging of specimens with a maximum field size of up to 220mm (8.6 inches). It is a versatile SEM that utilizes secondary and backscattered electron imaging (SEI and BSEI) for a variety of applications, such as semiconductor failure analysis, microelectronic device inspection, biological and material science-based research, and various other imaging and analysis tasks. JSM 5910LV is outfitted with a large circular field detector that can detect up to 1.4nm, which allows for excellent resolution, contrast, and detail when imaging specimens. It also comes with a built-in 15kV gas-field emission gun, which provides improved beam brightness and stability compared to traditional thermal emission guns. Additionally, JEOL JSM 5910LV features a dual-column design with a 3-dimensional sample-movement system, allowing for enhanced resolution, depth of field, and fine-scale positioning of the sample for imaging. In terms of image contrast, JSM 5910LV utilizes both secondary electron imaging and backscattered electron imaging (SEI/BSEI) to obtain the most accurate, detailed images of a specimen. By using both SEI and BSEI, the user can identify the composition and structure of the sample and distinguish materials of different compositions and densities. Additionally, the high-contrast images obtained by the SEM allow for precise measurements and analysis of sample features, making JEOL JSM 5910LV an excellent choice for basic imaging and advanced research applications. JSM 5910LV also comes with a variety of advanced analytical tools, such as an EDS (Energy Dispersive Spectrometer) which is used for elemental analysis, and an EDXRF (Energy Dispersive X-Ray Fluorescence), which is used to acquire quantitative elemental composition images. Moreover, JEOL JSM 5910LV has a built-in automated stage that can easily be used to image larger specimens or multiple specimens in sequence. The advanced stage can also be used for various other tasks, like stitch imaging, automation of data acquisition, and analysis. Overall, JSM 5910LV is a powerful, versatile scanning electron microscope that is capable of performing a variety of imaging and analysis tasks with excellent resolution and image contrast. It is ideal for applications such as failure analysis, semiconductor inspection, biological research, and materials science-based research. With its advanced stage and built-in analytical tools, JEOL JSM 5910LV allows for accurate, detailed imaging of samples and offers many opportunities for advanced research.