Used JEOL JSM 6010 Plus/LA #9284891 for sale
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ID: 9284891
Scanning Electron Microscope (SEM)
Main breaker: 15 AT. MP-60110LAB
ULVAC G-100DB Vacuum pump
Ultimate press: 6.7 x 10^-2 PA
Oil capacity: 800 ml
AETFL64PHOO1 Vacuum pump motor
Power supply: 100 V, 50/60 Hz
Pumping speed:
50 Hz 100 l/min
60 Hz 120 l/min
Capacitor:
Start rating: 51, 250 µF
Running: 32 µF
Capacitor motor thermal: 1 Phase
JEC-2137
IP44
1C411
6203 / 6202 Bearing
PSE IME:
R/MIN: 1450, 4 Pole, 60 Hz, 100 V, 5.3 A
R/MIN: 1745 X69001
Power supply: 0.4 kW, 50 Hz, 100 V, 6.1 A
ULVAC OMT-100A Oil mist trap
Maximum flow rate: 120 l/min
MP-01060MS Tilt limitation table
X/Y-Axis Z Holder: 10 mm, 32 mm, 76 mm
8 mm:
10 mm: 0-20 deg
32 mm: 0-20 deg
76 mm: 0-20 deg
10 mm:
10 mm: -2-30 deg
32 mm: -2-30 deg
76 mm: 0-20 deg
15 mm:
10 mm: -10-35 deg
32 mm: -10-35 deg
76 mm: -2-35 deg
20 mm:
10 mm. -10-35 deg
32 mm. -10-35 deg
76 mm. -10-35 deg
Dial reading: -10° - 90°
X-Ray microanalysis
P13333B-NAV Camera
DELL Optiplex 7010
CPU Tower
With PXL2230MW Planar
Monitor
P/N: 997-7039-00
DELL KB212-2 CN-04G481-71616 43B-006U-A00 DP/ N 04G481 Keyboard
DELL D PPID-CN-09RRC7-48729-45L-09FU Mouse
Accessories and manuals
Power supply: 100-240 V, 60/50 Hz, 0.7 A
Power supply: 100 V, 12 A, 1.2 kVA, 1 Phase, 50/60 Hz.
JEOL JSM 6010 Plus/LA is a versatile scanning electron microscope (SEM) for laboratory and industrial applications. The SEM operates with a superior-quality field emission gun (FEG) as its electron source to produce high resolution images at magnifications between x10 and x600,000, with a magnification range from x500 to x150.000. The work chamber is equipped with a range of ancillary equipment including a 6-axis motorised sample stage allowing for the manipulation of samples under vacuum to measure, inspect, and analyse a variety of materials. The JSM 6010 Plus/LA's scanning electron beam works by rapidly scanning a sample surface and collecting secondary electrons, which are then converted into a high-quality digital image display. Features such as continuous adjustment of the electron spot size, adjustable current, stigmation and voltage, are combined with the FEG's low-voltage performance and high energetic beams to enhance the SEM imaging capabilities. The JSM 6010 Plus/LA employs a wide array of detectors and detectors adapts, allowing the user to modify imaging parameters for a range of imaging techniques. A secondary electron detector (SED) provides a secondary electron engrossment image that is capable of distinguishing between different types of materials. An analytical detector, such as the energy dispersive spectroscopy system (EDS) or wavelength dispersive spectroscopy (WDS) system, can be adapted to allow for energy-dispersive X-ray measurements and elemental analysis. The JSM 6010 Plus/LA also hosts a sputter system, which allows for deeper analysis of exceedingly fragile samples, providing a wealth of information on the chemical makeup of the sample. Furthermore, the JSM 6010 Plus/LA offers the user multiple image manipulation options and the possibility to export the data in various file formats. Various layered images and composites can be created and the data can be used to generate 3D images. Thanks to its wide range of features, low power requirement, automatic alignment, and stable control software, the JSM 6010 Plus/LA provides superior performance for a wide array of laboratory and industrial applications with an unparalleled level of control, accuracy and speed.
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