Used JEOL JSM 6010 Plus/LA #9412718 for sale

JEOL JSM 6010 Plus/LA is a scanning electron microscope (SEM) designed for detailed observations of a wide range of samples, from insulators to conductors to semiconductors. As an analytical instrument, the 6010 Plus/LA can measure secondary electrons or X-rays for chemical and crystal structure analysis. Additionally, its impressive accelerative voltage of 30kV makes it possible to observe features and fine details with greater resolution. The JSM 6010 Plus/LA includes an array of superior features including an improved Oxford EDS detector that increases sensitivity and can detect elements up to U and Pb. Its high duty-cycle makes it possible to analyze samples quickly and with more accuracy. The sophisticated voltage regulator employed in the SEM can maintain the needle pressure control of the column to within 1 micron. The advanced electronic system of the 6010 Plus/LA is capable of operating the microscope indefinitely. This makes it a great choice for continuous operation or for frequent start-up/shutdown operations. The 6010 Plus/LA comes with a choice of three lenses each with its own unique abilities and resolution. A 0.5mm objective lens provides a maximum resolution of 3 nanometers and a 15mm field of view, while the 0.3mm objective lens allows for a 0.8 nanometer maximum resolution and impressive 5.2mm field of view. The 0.1mm objective lens is ideal for applications requiring highest resolutions, with a 0.3nm maximum resolution and a 1mm field of view capability. The ergonomic design of the 6010 Plus/LA includes full manual control of all its functions, allowing for greater precision when working with larger samples or conducting research and analysis. Additionally, the JSM 6010 Plus/LA comes with an easy-to-operate stage, designed to allow manual movement based on X-Y translation, dual tilt and advanced focal plane. With an easy to read 7" color LCD monitor, users can view images in high resolution, or with live magnification for faster and more accurate sample manipulation. In conclusion, JEOL JSM 6010 Plus/LA represents the cutting edge in scanning electron microcopy and offers a powerful array of features that make it perfect for a variety of research and analytical applications. With its advanced optics, high voltage capabilities and integrated Oxford EDS detector, the 6010 Plus/LA is a great choice for ultra-high resolution scanning electron microscope users.