Used JEOL JSM 6010 Plus/LV #9233065 for sale
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ID: 9233065
Scanning Electron Microscope (SEM)
With motorized X-Y stage
Resolution: 4nm at 20kV
Resolution in LV mode: 5nm
Magnification: 8x to 300,000x (5x Possible)
Includes:
Mini-environment / Airlock for air sensitive samples
Infrared chamber scope with P-I-P
External scan interface
Spare parts
Tools
Manuals
EPSON Printer
Does not include:
AZTEC Energy standard microanalysis system
OXFORD INCA EDS XMAXN 80mm Large area analytical silicon drift detector
KAMMRATH & WEISS TECHNOLOGIES:
Hot stage: 500°C
With PID controller
Water cooling
Data acquisition
Remote control
Holder
Accelerating voltage: 500V to 20kV.
JEOL JSM 6010 Plus/LV is a versatile scanning electron microscope (SEM) designed for use in a range of scientific settings. The column type equipment provides excellent electron optical performance, and an optimized resolution of 3nm. The instrument features a large, enhanced specimen chamber capable of accommodating samples of up to 100mm on all sides. It is equipped with a high-power electron source and a sample-shifting system, allowing for precise manipulation and imaging of larger specimens. The versatile imaging capabilities of JEOL JSM 6010 Plus/LV allow for observation of both topographical and elemental features. The unit is equipped with a rotatable LED-illumination machine capable of providing a variety of detectors, including in-lens secondary and back scattering detectors, for enhanced image quality. Supporting the magnifying power of the electron microscope, the incident beam can be adjusted to cover a wide range of magnifications. This is achieved with a movable optical access unit that is capable of providing a magnification range of 30x to 250,000x. As well as providing imaging capabilities, the JSM 6010 Plus/LV also has a range of data acquisition features, such as multi award-winning long scan and scanned-image reconstruction (SIR) capabilities. These scanning modes greatly improve the speed and accuracy of imaging processes. The high-resolution imaging capabilities of the instrument are further enhanced with the support of an X-Ray Linescanner (XLS) tool. This allows users to observe X-ray intensity variations for topographical and elemental imaging. The easy-to-use production capabilities of the JSM 6010 Plus/LV allow for efficient production of data and images. Through a simple touchscreen display, settings can be adjusted to maximize resolution, and the integrated AutoScan and Zoom Scan functions allow for improved workflow. Additionally, the asset is capable of saving and transferring data through multiple interfaces, ensuring efficient storage and sharing of large amounts of information. JEOL JSM 6010 Plus/LV is an advanced scanning electron microscope offering high resolution imaging, versatile data acquisition and simple production capabilities. These features make it an ideal instrument for a range of scientific settings including educational, research and industrial applications.
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