Used JEOL JSM 6010LA #293635747 for sale

JEOL JSM 6010LA is a high-performance scanning electron microscope (SEM) designed to leverage the power of electrons in a range of scientific studies. This device is equipped with a bright field scanning electron microscope featuring a thermal and field emission-type electron gun, a secondary electron detector (SED), an energy dispersive X-ray spectrometer and a wavelength dispersive X-ray spectrometer for elemental analysis. It can provide high-resolution imaging, X-ray mapping and analysis of specimen topography and composition. JSM 6010LA has the ability to provide low voltage observation and easily switch between operation modes of low and medium voltage imaging and analysis. The device is equipped with an automated equipment that controls the sample alignment for quick, easy and accurate operation and a stage height control that facilitates sample alignment and height adjustment. Other user-friendly features include multiple automated counting systems, automatic segmentation of specimen images and automated scanning of several samples simultaneously. JEOL JSM 6010LA utilizes a silicon drift detector (SDD) which allows for high resolution imaging and X-ray mapping at multiple kV and resolutions. It is also capable of producing multi-mode imaging and analysis functions including backscattered electron (BSE) mapping and in-depth imaging. JSM 6010LA is equipped with an integrated low vacuum system and a high-sensitivity SED which can be operated at both low and medium voltages and produce better results than conventional SEMs. In addition, this SEM is equipped with an electron-beam microprobe unit (EBMP) which provides a scanning electron spectrometer that is necessary for quantitative analysis of the sample. This machine can be used to map the elemental composition of the sample using energy dispersive analysis (EDX) with high sensitivity and low drift. The EBMP comes bundled with an integrated bright field viewing option, allowing for the viewing of specimen features and characteristics in crystal structure, grain size and shape. JEOL JSM 6010LA is a versatile scanning electron microscope that is capable of producing high-resolution imaging, X-ray mapping and analysis, and elemental analysis for a range of scientific studies. The range of automated and user-friendly features make it an attractive device for a wide variety of research applications.