Used JEOL JSM 6010LA #9220325 for sale

JEOL JSM 6010LA is a scanning electron microscope (SEM) designed for microstructural analysis of solid samples. It produces high-resolution images by scanning a focused electron beam across the sample surface whilst simultaneously collecting secondary electrons from the sample interaction. The 6010LA features a newly developed upper chamber which houses a cold field emission gun (CFEG) electron source and one of up to three detectors. This creates a spacious working environment that can be quickly and safely accessed, enabling the facility to perform a variety of intricate techniques. JSM 6010LA utilizes a variable-pressure secondary electron detector, allowing for imaging at low pressure with greatly reduced charging as well as ultra-deep imaging. This SEM is also capable of obtaining a wide range of surface topographical measurements using a method called 'profile recognition', which rapidly produces 3D images. Alongside this feature it also offers a diverse range of imaging capabilities, such as X-ray analyses with a separate system, so that the user is able to obtain both elemental and structural information from the same SEM. JEOL JSM 6010LA is designed to deliver the highest levels of scanning resolution and precision. Its in-column energy filter produces dramatically better resolution than conventional systems, resulting in outstanding detail and contrast. As well as advanced imaging capabilities, this SEM is ideal for high-accuracy chemical and elemental analysis. It provides unique elemental distribution images with high sensitivity and accuracy, due to its state-of-the-art energy filter for X-ray microanalysis. Finally, JSM 6010LA offers an ergonomic design, with its user-friendly interface providing easy operation. The intuitive software automatically sets the optimal instrument parameters, further optimizing productivity. In addition, a large variety of additional hardware options, such as a cryo-stage for low-temperature observations, are available to make the 6010LA more versatile and improve user experience. With all of these features combined, JEOL JSM 6010LA is the best choice for any microstructural analysis applications.