Used JEOL JSM 6060LV #9408117 for sale
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ID: 9408117
Scanning Electron Microscope (SEM)
With water cooler
Does not include EDS
(2) Vacuum pumps
HP Z230 Workstation
Resolution:
High vacuum mode: 3.5 nm (30 kV, 6 mm WD)
Low vacuum mode: 4.0 nm (30 kV, 6 mm WD)
Electron source: Pre-centered W hairpin filament
Magnification: x5 (48 mm WD) to 300,000 (149-Steps)
Image modes: Secondary electron image backscattered electron image
Detectors: Solid state type
Objective lens: Conical lens, WD 6 to 48 mm
Objective aperture: 30-Micron, manually centered with OL wobbler
Specimen stage: Eucentric goniometer
X: 80 mm
Y: 40 mm
Z: 5 to 48 mm
R: 360° (Endless)
T: -10 to 90°
Image store: 1280 x 960 Pixels
Analytical working distance: 10 mm for EDS and standard operation
Vacuum mode changeover:
Automatic PC interface controlled
LV Mode: 10-270 Pa
LV Detector: BEI and modes
Energy dispersive X-Ray microanalysis:
iXRF EDS Elemental analysis system
OXFORD INSTRUMENTS Si (Li) X-Ray detector, 10 mm²
Resolution (Mn K-Alpha): 130 eV
Light element detection (Be-U)
Sensitivities: Typically 0.1% - 1%
Qualitative analysis
Quantitative analysis
Digital X-Ray mapping and imaging, X-Ray linescans
Accelerating voltage: 0.5 to 30 kV (53-Steps)
Probe current: 1 pA to ~1000nA
Operating system: Windows 7.
JEOL JSM 6060LV Scanning Electron Microscope (SEM) is a tabletop SEM and is one of the most preferred models used in industrial applications and in universities and research laboratories. JEOL JSM 6060 LV offers a variety of features and capabilities that make it the perfect choice for a broad range of applications, from imaging samples in high detail to elemental analysis. With a field emission gun design and a high-brightness beam, the SEM is designed to provide optimized image quality. The scanning electron microscope is equipped with an InLens detector and is capable to perform secondary electron and backscattered electron imaging. It also has a large chamber size, which allows for sample analysis of non-conductive materials at a higher magnification range. The unit is designed to offer easy operation and a wide range of imaging methods. It has an ultra high-resolution that can reach a resolution of 4.5nm with a minimum working distance of 9mm. The unit also has a low-vacuum mode, meaning that it can work on non-conductive samples without a vacuum chamber. JSM 6060LV has a large variety of sample holders, enabling the user to perform a wide range of applications, including EDS, WDS, EDX, EBSD, and STM mapping. The maximum chamber pressure is low (< 5×10−3 Pa) and in addition, the unit is equipped with an auto alignment system. The unit also has an image stitching feature, allowing the user to capture composite images with 10 micron accuracy. Furthermore, the advanced software control system allows for fine adjustments for a wide range of applications. In conclusion, JSM 6060 LV Scanning Electron Microscope is a powerful, versatile and easy to operate SEM that is a great choice for both researchers and industrial users. The SEM offers excellent performance, with its large variety of sample holders, InLens detector, ultra-high resolution, low-vacuum mode, auto alignment system and image stitching feature. The SEM is well suited for a wide variety of materials, making it a great choice for numerous applications.
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