Used JEOL JSM 6060LV #9408117 for sale

Name: JEOL JSM 6060LV
Brand: JEOL
SKU: 9408117
Availability: InStock

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Scanning Electron Microscopes

Manufacturer

JEOL

Model

JSM 6060LV

ID: 9408117

Scanning Electron Microscope (SEM) With water cooler Does not include EDS (2) Vacuum pumps HP Z230 Workstation Resolution: High vacuum mode: 3.5 nm (30 kV, 6 mm WD) Low vacuum mode: 4.0 nm (30 kV, 6 mm WD) Electron source: Pre-centered W hairpin filament Magnification: x5 (48 mm WD) to 300,000 (149-Steps) Image modes: Secondary electron image backscattered electron image Detectors: Solid state type Objective lens: Conical lens, WD 6 to 48 mm Objective aperture: 30-Micron, manually centered with OL wobbler Specimen stage: Eucentric goniometer X: 80 mm Y: 40 mm Z: 5 to 48 mm R: 360° (Endless) T: -10 to 90° Image store: 1280 x 960 Pixels Analytical working distance: 10 mm for EDS and standard operation Vacuum mode changeover: Automatic PC interface controlled LV Mode: 10-270 Pa LV Detector: BEI and modes Energy dispersive X-Ray microanalysis: iXRF EDS Elemental analysis system OXFORD INSTRUMENTS Si (Li) X-Ray detector, 10 mm² Resolution (Mn K-Alpha): 130 eV Light element detection (Be-U) Sensitivities: Typically 0.1% - 1% Qualitative analysis Quantitative analysis Digital X-Ray mapping and imaging, X-Ray linescans Accelerating voltage: 0.5 to 30 kV (53-Steps) Probe current: 1 pA to ~1000nA Operating system: Windows 7.

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JEOL JSM 6060LV Scanning Electron Microscope (SEM) is a tabletop SEM and is one of the most preferred models used in industrial applications and in universities and research laboratories. JEOL JSM 6060 LV offers a variety of features and capabilities that make it the perfect choice for a broad range of applications, from imaging samples in high detail to elemental analysis. With a field emission gun design and a high-brightness beam, the SEM is designed to provide optimized image quality. The scanning electron microscope is equipped with an InLens detector and is capable to perform secondary electron and backscattered electron imaging. It also has a large chamber size, which allows for sample analysis of non-conductive materials at a higher magnification range. The unit is designed to offer easy operation and a wide range of imaging methods. It has an ultra high-resolution that can reach a resolution of 4.5nm with a minimum working distance of 9mm. The unit also has a low-vacuum mode, meaning that it can work on non-conductive samples without a vacuum chamber. JSM 6060LV has a large variety of sample holders, enabling the user to perform a wide range of applications, including EDS, WDS, EDX, EBSD, and STM mapping. The maximum chamber pressure is low (< 5×10−3 Pa) and in addition, the unit is equipped with an auto alignment system. The unit also has an image stitching feature, allowing the user to capture composite images with 10 micron accuracy. Furthermore, the advanced software control system allows for fine adjustments for a wide range of applications. In conclusion, JSM 6060 LV Scanning Electron Microscope is a powerful, versatile and easy to operate SEM that is a great choice for both researchers and industrial users. The SEM offers excellent performance, with its large variety of sample holders, InLens detector, ultra-high resolution, low-vacuum mode, auto alignment system and image stitching feature. The SEM is well suited for a wide variety of materials, making it a great choice for numerous applications.