Used JEOL JSM 6300F #116159 for sale

JEOL JSM 6300F is an advanced scanning electron microscope (SEM) designed for high performance imaging at sub-nanometer resolutions. It has an ultra-high resolution for both Scanning Electron Microscopy (SEM) and Transmission Electron Microscopy (TEM) applications. The robust and versatile design of JSM 6300F enables high-speed imaging with high throughput, low cost and extreme accuracy. JEOL JSM 6300F is equipped with an ultra-high resolution field emission gun (FEG), a large chamber with a large pole piece, and a high-performing electron optical system. It provides a wide variety of beam current and working distance options, allowing users to target their desired imaging objectives. This microscope also includes advanced functionality that includes EDAX (Energy Dispersive Analysis X-rays), automated navigation and alignment, an automated stage for sample preparation, and a multi-beam detection system for integrated imaging. The large chamber and improved pole piece enable JSM 6300F to achieve greater depths of field and higher resolution with fewer distortions. It is capable of imaging a variety of samples including living cells, non-living materials, soft and hard materials, as well as nano particles. The sample manipulation and auto-alignment functions allow for easy and accurate imaging even at very low magnifications. JEOL JSM 6300F offers flexibility and the highest performance in imaging, analysis and automation. Its high throughput and ability to achieve high resolutions make it a viable option for researchers looking to image small structures and analyze their material composition. The integrated electron optical system enables users to adjust the beam current, angle and working distance to maximize the resolution of their desired images, helping them to observe fine details and microstructures. The automated functions, analysis capabilities and its range of sample manipulation options make this SEM an attractive choice for various research applications.