Used JEOL JSM 6300F #53576 for sale

ID: 53576
FE SEM.
JEOL JSM 6300F is a scanning electron microscope (SEM) designed to aid in the study of small-scale objects and specimens with ultimate resolution. This advanced electron microscope offers high resolution imaging, superior sample to sample repeatability, and a range of flexibility to meet the requirements of a wide variety of applications. JSM 6300F features a high-resolution field emission gun (FEG) for producing a primary electron beam. Its cold state improves the stability of images and its high accelerating voltage makes imaging of thicker samples possible. The high electron beam current enables excellent image brightness and minimal charging of samples. A secondary electron detector, a backscattered electron detector, and a fast FE-secondary detector make up the three detectors of JEOL JSM 6300F. Combined with its high resolution hardware, this allows for a higher magnification imaging of complex structures. The system is equipped with imaging and analytical capabilities. Several imaging techniques, such as SE images, secondary electron image, BSE images, and SE/BSE image can be used independently or in combination. For qualitative evaluation, JSM 6300F's computer-assisted microscopy (CAM) imaging software is especially useful for quantifying internal features and works together with the software's wide range of adjustment tools. JEOL JSM 6300F also provides a range of analytical capabilities. It has a comprehensive selection of automated analysis and scanning techniques, such as automated spectra mapping, line profile analysis, area profile analysis, elemental analysis, and more. The powerful onboard X-ray feature offers high-resolution view of even submicron areas. These features, combined with its ease of use, make JSM 6300F an ideal tool for materials science, surface engineering, device physics, biology, and other research and development applications. Its high levels of automation, fine calibration, and reliable repeatability make it one of the most powerful SEMs currently available.
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