Used JEOL JSM 6300F #9224609 for sale

JEOL JSM 6300F is a Scanning Electron Microscope (SEM) with a wide range of features and capabilities. It can be used to analyze materials of various sizes and shapes through a variety of modes and interactive functions. The microscope provides higher resolution and ultra-high vacuum (UHV) performance. JSM 6300F is equipped with a field emission gun (FEG) that has a cold field emission gun type thermionic emission voltage of 1.2 kV and a hot field emission gun type thermionic emission voltage of 1.3 kV. The microscope also features a twin xy tilting and scanning stage that allows for fast, efficient image acquisition. The vacuum chamber is equipped with an integrated auto-levelling system, and the samples are placed on a retractable sample holder. JEOL JSM 6300F offers a range of detection modes, including conventional SEM, High Vacuum (HV) SE, Low Voltage SE, and backscattered electron (BSE) imaging. It also offers a full range of visualizing and analyzing capabilities such as EDS, X-ray map, ion milling, water immersion imaging, and integrated image processing functions like averaging, de-noising, and optical correction. The microscope is compatible with both Windows and Mac operating systems, and comes with bundled software that enables the user full control over their data. JSM 6300F is also equipped with a retractable Live SEM working chamber that allows the user to perform both dry and in-situ experiments. Overall, JEOL JSM 6300F provides users with enhanced resolution and precision in their imaging and analysis capabilities. It boasts intuitive operation, enabling the user to quickly and efficiently conduct their SEM experiments. Through its comprehensive data manipulation tools, high resolution imaging, and versatile operating system compatibility, JSM 6300F is an ideal scanning electron microscope for a wide range of research and educational applications.