Used JEOL JSM 6300V #9016383 for sale

JEOL JSM 6300V is a high-performance scanning electron microscope (SEM) designed for reliable sample imaging and analysis. This instrument's scanning electron optics produce excellent images due to the high vacuum system, powerful electron optics and advanced computer control. The microscope has an accelerating voltage range of 0.1 - 30 kV, which enables the imaging of both conductive and non-conductive samples. JSM 6300V is equipped with a digital scintillator for X-ray imaging of elements from magnesium to uranium. Its Fast X-ray Camera (FSC) is able to detect and analyze X-ray signals from these elements. The versatility of this instrument also allows for easy switching between various detector and imaging modes such as secondary electron imaging, backscattered electron imaging, and X-ray microanalysis, which can be used for various applications. This tool offers several features that allow users to obtain detailed analysis of their sample. The Smart Scan features simplify sample operation and reduce imaging and analysis time. It also offers improved scanning speed and a high degree of accuracy. Thanks to an image processing system, users can get a better understanding of their sample structure, plus the IQ Scan feature enables effective imaging regardless of sample size. JEOL JSM 6300V also provides a user-friendly interface, with the 6300V Control Software (version 3.4) allowing users to create their own imaging and analysis programs. Its software provides a wide range of sophisticated and advanced features, such as segmentation and edge detection, 3D-image analysis, and auto-sampling. Overall, JSM 6300V is a powerful scanning electron microscope that offers excellent imaging and analysis of samples. Its advanced features give users the ability to quickly and accurately gather detailed information about their sample. The versatility of this microscope allows it to be used for a variety of applications, making it a great choice for any laboratory.