Used JEOL JSM 6320F #9210344 for sale

JEOL JSM 6320F is a scanning electron microscope (SEM) for use in materials analysis. It is an industry-standard micro-imaging and microanalytical system for analyzing sub-micron to macroscopic features. It is capable of visualizing fine features of samples, such as pores and grain boundaries, with a resolution of up to 0.06nm and provides statistical imaging, analytical information, and 3D modeling. JSM 6320F is equipped with electron optics and advanced detectors that enable the user to achieve maximum analytical performance. The imaging capabilities of the 6320F can be used to analyze grain size and orientation, surface roughness, microscopy, and many more applications. With an annular field of view SEM imaging, JEOL JSM 6320F provides a combination of large depth of field, high resolution images, and an enhanced field of view. The analytical capabilities of the 6320F include energy dispersive x-ray spectroscopy (EDS), which allows the user to analyze elemental composition of samples. In addition, the high vacuum and low voltage electron environment of JSM 6320F provides high-quality images of samples without the need for heavy sample preparation. JEOL JSM 6320F is suitable for a wide range of industries, such as metallurgy, automotive, electronics, and food. The 6320F offers users a simple operation that is supported on Windows XP and Windows Vista operating systems. The 6320F has the capacity of up to 2 samples and 5 detectors, allowing the user to analyze a wide range of sample types. In summary, JSM 6320F is an industry-standard scanning electron microscope used for materials analysis. It is capable of visualizing fine features of samples with a resolution of up to 0.06nm and provides statistical imaging, analytical information, and 3D modeling. The 6320F offers users a simple operation and the capacity to analyze a wide range of sample types. This microscope is suitable for a wide range of industries, making it a powerful tool for materials analysis.