Used JEOL JSM 6320F #9232338 for sale

JEOL JSM 6320F is a field-emission scanning electron microscope (SEM) available for high-resolution imaging of many types of samples. It is equipped with a highly efficient field-emission gun (FEG) and digital in-column detector for imaging, and a comprehensive range of controls allows for precise scanning and imaging. JSM 6320F is capable of generating highly detailed images with a resolution of up to 2.5 nm, while a variable pressure system allows the observation of non-conductive samples with minimal or no sample preparation. JEOL JSM 6320F has an acceleration voltage ranging from 1 kV to 30 kV and is able to generate a stable and uniform beam with low-noise imaging even at high magnification. The microscope's in-column energy dispersive spectrometer (EDS) allows for the detection and analysis of light elements, while an automated navigation system guides the user through specimen alignment. Automated functions such as tilt stabilization and image stitching reduce the time it takes to fully characterize a sample. JSM 6320F has a unique design that includes a flexible, well-lit optical column and an ergonomically designed, air-balanced stage that guarantees precise navigation and helps prevent sample drift. Easily customizable imaging configurations allow for the generation of detailed images in a range of materials and at varying magnifications. Additionally, the microscope is well suited for applications such as microanalysis, cast plate analysis, microprobing, and particle size analysis. JEOL JSM 6320F is a comprehensive tool designed to enable high-resolution imaging of a wide variety of samples. With its advanced investment in field-emission technology and comprehensive imaging functions, the microscope provides users with unparalleled resolution and control to efficiently analyze samples.