Used JEOL JSM 6320FZ #9386490 for sale

JEOL JSM 6320FZ is a high-performance scanning electron microscope (SEM) with a wealth of powerful and versatile features. It is characterized by its excellent low-vacuum performance, with field emission source capability and enhanced analytical capability. The first notable feature of JSM 6320FZ is its field emission source capability. This allows the microscope to operate in low vacuum conditions and reduces the potential for sample damage. The field emission source also provides a high degree of stability and accurate control, ensuring maximum resolution and image performance. JEOL JSM 6320FZ is also installed with a fast, high-resolution digital imaging equipment, which enables researchers to acquire high-resolution images of samples with minimal distortions. This system incorporates both secondary electron and backscatter electron detectors for enhanced image contrast and detail. It features an innovative STEM imaging unit, which offers superior resolution combined with enhanced imaging contrast and detail. In addition, JSM 6320FZ is equipped with advanced analytical capabilities, including energy dispersive X-ray spectroscopy (EDS) and electron backscatter diffraction (EBSD). These techniques allow researchers to identify and analyze the elemental composition and crystallographic structure of samples. JEOL JSM 6320FZ includes an ultra-high vacuum stage, which provides superior acceleration voltage stability for improved electron beam performance. Moreover, JSM 6320FZ is designed with an advanced specimen movement machine, which is capable of speedily and accurately positioning samples for optimal imaging and analysis. It includes a variety of motorized stage options, as well as automated fine-tuning of the tilt, alignment and magnification. Overall, JEOL JSM 6320FZ is a high-performance scanning electron microscope with a suite of features and analytical capabilities. It offers excellent field emission source capability, ensuring high resolution images and minimized sample damage. With an ultra-high vacuum stage, advanced imaging and analysis options, and automated fine-tuning capabilities, JSM 6320FZ is a powerful tool for microscopy researchers.