Used JEOL JSM 6335F #293609259 for sale

JEOL JSM 6335F is a scanning electron microscope (SEM) used for imaging samples and measuring surface topography. It is a field-emission SEM (FE-SEM) equipped with a Cold Field Emission Gun (Cold FEG) for optimal specimen imaging and charging. This allows for higher electron beam current, improved resolution, and greater flexibility when accessing various types of sample materials. JSM 6335F is equipped with a variable pressure ultra-high vacuum scanning electron column that offers a variable pressure range from 0.1 to 0.09 Pa. This navigation system provides exceptional navigation properties with the precision of 0.05 um at an objective distance of 10 mm. The SEM further features an automated deflection capability with a digital signal processor (DSP) control, allowing the user to address complex and challenging sample analysis scenarios. This SEM is designed with several analysis features, including both elemental and chemical analysis, X-ray imaging and mapping, electron and photon-induced secondary electron imaging, and X-ray Energy Dispersive Spectroscopy (XEDS). Additionally, this SEM is equipped with a full suite of analytical tools including Backscatter Electron Diffraction (BSED), High Resolution Backscattering Electron (HRBE) imaging, Pole Figure Imaging (PFI) for texture analysis, and Low Voltage Backscatter Electron (LVBE) imaging. JEOL JSM 6335F is compatible with a variety of sample holders for samples ranging from thin film structures to dried biological specimens, as well as various samples of different geometries and sizes. Additionally, the SEM includes a bright field detector (BF), Dark Field detector (DF), and a Long Working Distance (LWD) detector that can image a sample at a distance of up to 4 millimeters. JSM 6335F SEM has a working chamber of 300 × 300 mm and can handle sample sizes up to 180 mm in diameter. JEOL JSM 6335F is a reliable and efficient SEM built to provide users with accurate and detailed images. The overall design of the 6335F offers flexibility and superior imaging capabilities that make it an ideal SEM for a variety of applications, from research to industrial settings.