Used JEOL JSM 6335F #293744719 for sale

JEOL JSM 6335F is a high-resolution, analytical scanning electron imaging system that enables detailed analysis of surfaces and the internal structures of a wide range of organic and inorganic materials. This benchtop SEM device is equipped with a large chamber, providing the technician with an ample workspace for sample manipulation and observation. Its EverHigh X-ray source offers greater stability and reliability compared to previous models. JSM 6335F comes standard with an in-lens secondary electron detector and a high-end backscatter detector that is capable of detecting particles across a wide angle. The secondary electron detector enables the user to capture topographical surface features of the specimen in great detail, while the backscatter detector allows for analysis of the specimen composition and the cross-sectional imaging of embedded structures. The SEM also features a Focused Ion Beam (FIB) Scanning/Scanning Transmission Electron Microscope (STEM), allowing for fine-scale imaging of biological specimens, including soft tissues. This FIB scanning system has a special 3rd Generation Column design, which increases its performances in terms of accuracy, resolution and magnification. The integrated energy-dispersive X-ray spectrometer allows analysis of elemental composition of the specimen, enabling maximum characterization of the material's makeup. JEOL JSM 6335F is designed for fast and reliable image capture; with the ability to capture 2D images in less than 5 seconds and single shot 3D images in less than 10 minutes. The device is extremely user-friendly, with a touchscreen control panel, intuitive graphical user interface, and useful features such as handwriting recognition. As well, powerful tools such as the Autostage feature enable sample positioning and processing to be done as quickly as possible without user intervention. Finally, the library of applications available for JSM 6335F makes the device suitable for a wide range of applications, from metallurgy and ceramics to chemistry and research in semiconductor and nanotechnology. Its wide range of capabilities make it an ideal choice for imaging and analysis of micro- and nano scale specimens.